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Ready for future applications today
- Future-proof hardware concept
- RF section with high output level up to 6 GHz
- Wide RF signal bandwidth of up to 120 MHz with internal signal generation
- Maximum RF bandwidth of I/Q modulator exceeds 500 MHz
- Always up-to-date with software upgrades
Instrument Overview
Frequency response of the I/Q modulator with bandwidth of over 500 MHz
Customized internal signal generation with optional baseband generator
- Baseband coder with realtime capabilities for direct signal generation
- Integrated ARB for playback of precalculated waveforms
- Availability of ARB-only versions with different bandwidths
- Memory depth of up to 256 Msamples for long test sequences with option R&S®SMBV-B55
| Version |
Option |
Baseband
generator |
RF
bandwidth |
|
| 1 |
R&S®SMBV-B10 |
Baseband coder with
realtime capabilities
and ARB (32 Msample
or 256 Msample) |
120 MHz |
| 2 |
R&S®SMBV-B50 |
ARB only (32 Msample
or 256 Msample) |
120 MHz |
| 3 | R&S®SMBV-B51 |
ARB only (32 Msample
or 256 Msample) |
60 MHz |
Support for all important state-of-the-art digital standards
- Straightforward signal configuration due to easy-to-use GUI
- 2G/3G/LTE mobile radio standards
- Wireless standards including mobile WiMAX and WLAN IEEE 802.11n
GUI of the R&S®SMBV100A showing the large variety of internally available digital standards (optional)
Graphical display of settings for digital standards, e.g. EUTRA/LTE
High-performance RF for all types of applications
- Excellent phase noise ensures low EVM with digital signals
- High output level compensates for losses in test/system setup
- Fast settling time for quicker measurements
- Analog modulation for basic measurements
Measured SSB phase noise with internal OCXO (R&S®SMBV-B1 option)
Measured maximum output power vs. frequency
Histogram of measured level setting times in I/Q mode
Flexible signal processing and baseband connectivity
- CW interference and AWGN simulation
- Analog baseband outputs
Superposition of LTE signal with AWGN
Low cost of ownership due to simple service concept
- Fast on-site servicing
- Long calibration interval (three years) minimizes service costs
- Straightforward modular design for short repair times
Allrounder and specialist at the same time
Optimized for high production throughput
- Multisegment waveform mode for fast switchover between test sequences
- High level repeatability ensures stable test conditions
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